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Technical Illustrations - Microsystems

Technical Illustration: Microsystems
Client - DARPA, Microsystems Technology Office (MTO)

Below are illustrations which served as visual aids to key technical concepts in briefings, press releases and program events.  A summarized, high-level description of complex technical information is supported by these graphics, which are designed for full technical accuracy within notional concepts of leading-edge science.  These illustrations were made to support programs in microsystems technology.
This illustration of a stacked integrated circuit was built to serve as a visual representation of MTO for the office landing page on Darpa.mil
Millimeter wave vacuum tubes, including ones like the traveling wave tube (TWT) depicted here, amplify signals by exchanging kinetic energy in the electron beam (shown as a blue line) with electromagnetic energy (shown as a wave) in the signal. This figure represents a cutaway view of a TWT with all of the critical components - electron gun, magnetic circuit, electron collector, and the windows that keep the vacuum inside the tube while letting the signals flow in and out. featured here: http://www.darpa.mil/news-events/2015-08-11
This graphic was produced to help illustrate technical concepts for the Cortical Processing program, including HTM memory and object recognition, and machine learning.  It was one of first visual examples available for the technical concepts represented.
‍This rendition depicts a single imaging sensor, in this case one that is aboard an unmanned aerial vehicle, simultaneously operating in three potential ReImagine modes—3D-mapping at the lower left, vehicle detection and tracking, and thermal scanning for industrial activity—in different regions of the same field of view. Today a single camera cannot do all of these things.
Technical Illustrations - Microsystems
Published:

Technical Illustrations - Microsystems

Below are illustrations which served as visual aids to key technical concepts in briefings, press releases and program events.  A summarized, hig Read More

Published: